QFN28/QFN4x5-28L Clamshell Chip Burn-in Test Socket, High Temp Resistant, 6:8 Arrangement

This high-quality burn-in test socket is designed for reliability and durability in chip testing applications. It features a clamshell design suited for QFN packages with a 4x5mm configuration and a pin count of 28. Engineered to resist high temperatures, it ensures stable performance in demanding environments. The socket's 6:8 pin arrangement facilitates precise and secure connections, making it an essential tool for efficient chip assessment and testing processes. Part Number: QFN4X5-28L(0.5) Model: QFN28 Manufacture country: China Instructions included: No